@misc{indiciaec2c7b98e8e04,
  title = {Measurement of illite particle thickness using a direct Fourier transform of small-angle X-ray scattering data},
  author = {Chao Shang and James A. Rice and Dennis D. Eberl and Jar-Shyong Lin},
  year = {2024},
  doi = {10.1346/ccmn.2003.0510305},
  url = {https://pubs.usgs.gov/publication/70025675},
  note = {Source identifier: 70025675}
}