TY  - RPRT
TI  - Complex resistivity of fault gouge and its significance for earthquake lights and induced polarization
AU  - David A. Lockner
AU  - James D. Byerlee
PY  - 2012
DO  - 10.1029/gl012i004p00211
UR  - https://pubs.usgs.gov/publication/70012796
ID  - 70012796
ER  -