Electronprobe analysis of "cosmic" particles
No abstract available.
Annals of the New York Academy of Sciences↗
Geology topics
I. Adler
Publications and source records attributed to I. Adler.
The detection of sulphur in contamination spots in electron probe X-ray microanalysis
Sulphur has been identified as one of the elements present in the contamination spot which forms under the electron beam in the microprobe. The presence of the sulphur results in a rapid change in intensity measurements causing a loss of observed intensity for elements other than sulphur. The source of sulphur has been traced at least in part to the Apiezon B diffusion pump oil. A comparative X-ray fluorescence study of the Apiezon B and Octoil diffusion pump oils showed substantial amounts of sulphur in the Apiezon B. The Octoil was relatively free of sulphur.
British Journal of Applied Physics↗
X-ray spectrographic determination of cesium and rubidium
An x-ray spectrographic method for the determination of rubidium and cesium was developed, using the internal-standard method and a four-channel flat-crystal spectrograph. The sensitivity is within 0.1% for cesia and 0.02% for rubidia; the precision is within 10% of the amount present. Results agree well with those obtained by flame photometry and by radio-activation.
Analytical Chemistry↗
Lunar surface chemistry: A new imaging technique
Detailed chemical maps of the lunar surface have been constructed by applying a new weighted-filter imaging technique to Apollo 15 and Apollo 16 x-ray fluorescence data. The data quality improvement is amply demonstrated by (i) modes in the frequency distribution, representing highland and mare soil suites, which are not evident before data filtering and (ii) numerous examples of chemical variations which are correlated with small-scale (about 15 kilometer) lunar topographic features.
Science↗
Simple X-Y translation stage and indexing mechanism
No abstract available.
Review of Scientific Instruments↗
Metallic spherules in tektites from Isabela, Philippine Islands
Iron-nickel spherules, as much as 0.5 mm in diameter, have been found completely embedded in some philippinites. The spherules consist mainly of kamacite with unidentified pink inclusions. The meteoritic origin of these spherules seems reasonable, suggesting that the tektites containing them were formed by asteroidal or meteoritic impact.
Isabela↗
Reflecting curved-crystal X-ray spectrograph; a device for the analysis of small mineral samples
A curved-crystal reflecting spectrometer of the type described by Birks and Brooks of the Naval Research Laboratories, but adapted for use in mineralogical studies, has been built in the Geological Survey. It has been successfully applied to the analysis of tiny crystals, zones in minerals, and individual grains in mixed-mineral specimens such as thin or polished sections, on grains or areas about 0.5 mm in diameter, X-ray diffraction spindles, and small samples of powder weighing a fraction of a milligram have also been analyzed without any loss or alteration of the sample. Of great value in thin- and polished-section work is the fact that this technique can be used to analyze selected areas without mutilating the specimen by digging out grains.A modification of the curved-crystal spectrometer has made it possible to traverse a standard polished section in synchronization with a recorder, automatically plotting the distribution of various elements along a selected line. This method was applied, for example, to a polished section containing a central core of pyrite intergrown with and surrounded by a marcasite-like mineral. Chemical analysis of a concentrate of these two minerals gave selenium, cobalt, and iron as major constituents. A clear relationship between the cobalt, selenium, and iron was established by the X-ray method, identifying the second mineral as an intermediate member of the FeSe 2 -CoSe 2 series.
Economic Geology↗
Internal standards in fluorescent X-ray spectroscopy
The use of internal standards in the analysis of ores and minerals of widely-varying matrix by means of fluorescent X-ray spectroscopy is frequently the most practical approach. Internal standards correct for absorption and enhancement effects except when an absorption edge falls between the comparison lines or a very strong emission line falls between the absorption edges responsible for the comparison lines. Particle size variations may introduce substantial errors. One method of coping with the particle size problem is grinding the sample with an added abrasive.
Spectrochimica Acta↗
Determination of thorium by fluorescent x-ray spectrometry
A fluorescent x-ray spectrographic method for the determination of thoria in rock samples uses thallium as an internal standard. Measurements are made with a two-channel spectrometer equipped with quartz (d = 1.817 A.) analyzing crystals. Particle-size effects are minimized by grinding the sample components with a mixture of silicon carbide and aluminum and then briquetting. Analyses of 17 samples showed that for the 16 samples containing over 0.7% thoria the average error, based on chemical results, is 4.7% and the maximum error, 9.5%. Because of limitations of instrumentation, 0.2% thoria is considered the lower limit of detection. An analysis can be made in about an hour.
Analytical Chemistry↗
Aluminum powder as a binder in sample preparation for X-ray spectrometry
[No abstract available]
Analytical Chemistry↗